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Mots clés
SiC
Photoluminescence
Kossel diffraction
XPS
Isotopic Tracing
Topological insulators
Metal-insulator transition
Oxidation
17Op
Thin films
Low energy electron diffraction LEED
Silicon carbide
7550Pp
Indium oxide
27Alda
Growth
Ferromagnetic resonance
Sputtering
Magnetic anisotropy
Aluminium
NRP
Alloys
Adsorption Isotherms
Silicon
AFM
Alloy
Hysteresis
Pulsed laser deposition
Oxygen deficiency
Raman spectroscopy
Adsorption
GaMnAs
Transparent conductive oxide TCO
Acoustic
Aluminum
Multilayer
Adsorbed layers
Stable isotopic tracing
6855Jk
Measurement
Energy loss
Rutherford backscattering spectrometry RBS
18O resonance
Magnetization curves
Defects
Pb centers
Ion implantation
Interface defects
XRD
HfO2
7630Lh
Gold
15N
Gallium oxide
Nitridation
Acoustic propreties of solid
Silicon Carbide
Atomic Layer Deposition ALD
Periodic multilayer
27Aldp
PIXE
AC susceptibility
Diffusion
27Ald p&α
Annealing
17Opp
13C
Nuclear resonance profiling NRP
Epitaxial growth
Charge exchange
Epitaxy
ADSORPTION DESORPTION HYSTERESIS
7550Ee
Channeling
Ageing
Density functional theory
Nickel
Auger electron spectroscopy AES
Silica
ALD
Nuclear reaction analysis
Zinc oxide
EPR
Thin film
Al2O3
Topological defects
8140Ef
Nanostructures
RBS
Evaluation
Passivation
Ion beam analysis
18O
3C-SiC
Magnetic semiconductors
Capillary condensation
17O
Nanoparticles
2H
X-ray diffraction